Introducing the SignatureSPM™: an automated AFM platform integrated with Raman spectroscopy for advanced nanotechnology ...

Carbon nanotube atomic force microscopy probes represent a significant advancement in nanoscale imaging and surface characterisation. Owing to the exceptional mechanical strength, high aspect ratio ...

Knowing interaction forces between nanostructures and their substrates is important in nanomanufacturing, such as template-directed assembly. A new mechanical membrane-based AFM (atomic force ...

This article introduces Park Systems' latest large-sample atomic force microscope (AFM), the FX200—engineered to support both foundational studies and advanced research applications. Designed for ...

This article introduces the FX200, the latest large-sample Atomic Force Microscope (AFM) from Park Systems, developed to meet both fundamental and advanced research requirements. The FX200 is ...

Thought LeaderProf. Dr. Sergei KalininProfessor & Chief Scientist in AI/ML for Physical SciencesUniversity of Tennessee & Pacific Northwest Laboratory In this interview, Prof. Dr. Sergei Kalinin ...

AzoMaterials speaks to Cassandra Phillips and Qichi Hu from Bruker about how their new Resonance-Enhanced Force Volume AFM-IR technology overcomes the limitations of conventional nanoscale ...

Atomic force microscopy (AFM) is a cornerstone technique for nanoscale manipulation, and has applications in nanoparticle assembly, biomolecule handling, semiconductor device manufacturing, etc.

New model extracts stiffness and fluidity from AFM data in minutes, enabling fast, accurate mechanical characterization of living cells at single-cell resolution. (Nanowerk Spotlight) Cells are not ...